Showing results: 376 - 390 of 5213 items found.
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Data Patterns Pvt. Ltd.
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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EHVC SERIES -
EMIC Corporation
The EHVC Series is designed for highly accelerated life testing, the demand of which from customers is increasing today. This is a joint system of the AGREE chamber and thermal shock chamber that we have manufactured and makes the temperature rate up to 20℃/min feasible with a compressor only. With this feature, the highly accelerated life test such as AGREE tests, most thermal shock tests can be performed with one unit.
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Finero OY
This modular battery test system provides for manufacturers versatile testing possibilities. Due to modularity it allows easy configuration of battery testers for a wide range of different power levels.
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Teseda Corporation
The original Teseda system for bench-top stimulus, test pattern debug, validation, device failure mode stimulation in-situ with other Failure Analysis lab equipment such as an EMMI, etc.
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WiMedia Explorer 300 -
Ellisys Sàrl
The WiMedia Explorer 300 is the world's first over-the-air MB-OFDM protocol test system for WiMedia Alliance's Ultrawideband common radio platform, Wireless USB protocol and Bluetooth.
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N5511A -
Keysight Technologies
The Keysight N5511A phase noise test system (PNTS) lets you measure at the limits of physics with readings down to kT (-177 dBm/Hz). The N5511A PNTS is a replacement for the gold-standard Keysight E5500 phase noise measurement system and is designed to meet the needs of phase noise power users.
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58131 -
Chroma ATE Inc.
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
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MS7208 -
MiNT Systems Corporation
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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Model 3150 -
TSI Inc.
The Component Filter Test System (CFTS Model 3150) from TSI, consists of software and a hardware module to provide an off the shelf solutions for all your custom filter testing needs. Pre-configured to work with TSI’s world class detectors and sizers the CFTS provides a platform for numerous filter test applications.
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TPP -
Mess- & Prüfsysteme GmbH
The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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ACTS -
Trilithic Inc.
As the name suggests this new server performs a variety of tests related to cable system advanced communication services, including VoIP and high speed data. The server enables a VoIP RTP test from any field test point with or without Unsolicited Grant Service (UGS), as well as high speed throughput (UDP up to 40 Mbps max). The VoIP test enables efficient service pre-installation verification with a simple, yet comprehensive set of measurement data including upstream and downstream latency, jitter, packet loss and MOS.
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Ball Systems, Inc.
Built-to-print / test system replication addresses your internal capacity and capability constraints. Ball Systems has perfected quoting, procurement, planning, assembly, testing, quality, delivery and installation to ensure your testers are on-time and on-budget, and meet design and production standards while keeping open and transparent communication.
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SPA1241 -
Elite RF, llc
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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SPA441 -
Elite RF, llc
The S - Series multi-purpose RF test system can be used in many applications such as R&D lab, ATE factory testing, EMC testing, field testing, and general purpose RF design. The S - Series is a flexible alternative to expensive and bulky RF test equipment. As shown in the setup in the upper right the S-Series system can be utilized to simultaneously provide all RF functions using its 7 inch front panel display or can be connected to a larger monitor for ease of viewing multiple windows at the same time
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TA-500 -
Tech-Aid Products
This panel was designed to test primarily the NSD360 series of HSI systems. Panel allows running the complete system on the bench. Included is a panel mounted TA-902 API which can also be used for testing external instruments via a panel mounted switch. The API and standard meter drives allow testing many different instruments.